REHMAN, U.; MAHMOOD, K.; ALI, A.; IKRAM, S. Comparison of Thermoelectric Properties of ZnO and ZnSnO Thin Films Grown on Si Substrate by Thermal Evaporation. Journal of Materials and Physical Sciences, [S. l.], v. 1, n. 2, p. 78–86, 2020. DOI: 10.52131/jmps.2020.0102.0008. Disponível em: https://journals.internationalrasd.org/index.php/jmps/article/view/608. Acesso em: 23 nov. 2024.